| 标准号 & 类别 | 标准名称 | 发布 |
|---|---|---|
| DB1404/T 20-2021 规范 |
Classification of UVC LED Chip Specifications for Disinfection
|
2021-11-20 山西省标准 |
| EN 2115:2009 试验 |
航空航天系列.铝合金2117-T42.实心铆钉用线材.D≤10 mm Aerospace series - Aluminium alloy 2117-T42 - Wire for solid rivets - D less than or equal to 10 mm
|
2009-02-01 欧洲标准化委员会 |
| GB/T 36359-2018 规范 |
Semiconductor optoelectronic devices.Blank detail specification for lower power light-emitting diodes
|
2018-06-07 国家市场监督管理总局 |
| MT/T 1092-2008 规范 |
Specification for LED or LED modules of cap lamp
|
2009-12-11 行业标准-煤炭 |
| SJ 52146/1-1996 规范 |
Detail specification for type Gs1113 red LED numeric display
发光强度 |
1996-1-1 行业标准-电子 |
| SJ 52146/2-2002 规范 |
Detail specification for low power dissipation numerical display for type GS1113K
发光强度 |
2002-10-30 行业标准-电子 |
| SJ/T 10954-1996 规范 |
电子元器件详细规范 2CK120型硅开关二极管（可供认证用） Detailed specifications for electronic components - 2CK120 silicon switching diodes (Applicable for certification)
|
1996-1-1 行业标准-电子 |
| SJ/T 11866-2022 规范 |
Semiconductor optoelectronic devices - Detailed specifications for silicon substrate white light power light emitting diodes
光通量 |
2022-10-20 行业标准-电子 |
| SJ/T 12069-2025 试验 |
Semiconductor Devices - Discrete Devices - Test Methods for Electrical Parameters of Silicon Carbide Diodes
|
2025-12-19 行业标准-电子 |
| SJ/T 2658.1-2015 试验 |
Measuring method for semiconductor infrared-emitting diode.Part 1: General
半导体红外发射二极管 辐射功率 |
2015-10-10 行业标准-电子 |
| SJ/T 2658.14-2016 试验 |
Measurement methods for semiconductor infrared emitting diodes Part 14: Junction temperature
半导体红外发射二极管 结温 |
2016-01-15 行业标准-电子 |
| SJ/T 2658.2-2015 试验 |
Measuring method for semiconductor infrared-emitting diode.Part 2: Forward voltage
半导体红外发射二极管 |
2015-10-10 行业标准-电子 |
| T/CSA 047-2019 试验 |
Measurement Method for Real Thermal Resistance and Impedance of Light Emitting Diodes
结温 |
2019-12-30 中国团体标准 |
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