破坏性物理分析方法是依据GJB 4027A-2006标准规定的用于美利体育登录入口官网电子元器件内部缺陷(如分层、空洞、裂纹等)的测试方法。它通过破坏性手段分析元器件内部结构和失效机理,以评估产品质量和可靠性。
| 标准号 & 类别 | 标准名称 | 发布 |
|---|---|---|
| GJB 4157/1-2011 规范 |
CCS410805型高可靠无引线片式1类多层瓷介固定电容器详细规范 Detail specification for fixed chip ceramic dielectric nonleaded class 1,type CCS410805 capacitors with high reliability
可焊性 |
2011-12-25 国家军用标准-总装备部 |
| GJB 4157/10-2011 规范 |
CTS411812型高可靠无引线片式2类多层瓷介固定电容器详细规范 Detail specification for fixed chip ceramic dielectric nonleaded class 2,type CTS411812 capacitors with high reliability
|
2011-12-25 国家军用标准-总装备部 |
| GJB 4157/11-2011 规范 |
CTS412220型高可靠无引线片式2类多层瓷介固定电容器详细规范 Detail specification for fixed chip ceramic dielectric nonleaded class 2,type CTS412220 capacitors with high reliability
超声波检查 |
2011-12-25 国家军用标准-总装备部 |
| GJB 4157/12-2011 规范 |
CTS412225型高可靠无引线片式2类多层瓷介固定电容器详细规范 Detail specification for fixed chip ceramic dielectric nonleaded class 2,type CTS412225 capacitors with high reliability
可焊性 |
2011-12-25 国家军用标准-总装备部 |
| GJB 4157/13-2011 规范 |
Detail specification for fixed ceramic dielectric leaded class 1,type CCS405 capacitors with high reliability
|
2011-12-25 国家军用标准-总装备部 |
| GJB 4157/14-2011 规范 |
Detail specification for fixed ceramic dielectric leaded class 1,type CCS406 capacitors with high reliability
超声波检查 |
2011-12-25 国家军用标准-总装备部 |
| GJB 4157/16-2011 规范 |
Detail specification for fixed ceramic dielectric leaded class 2,type CTS405 capacitors with high reliability
超声波检查 |
2011-12-25 国家军用标准-总装备部 |
| GJB 4157/17-2011 规范 |
Detail specification for fixed ceramic dielectric leaded class 2,type CTS406 capacitors with high reliability
|
2011-12-25 国家军用标准-总装备部 |
| GJB 4157/3-2011 规范 |
CCS411210型高可靠无引线片式1类多层瓷介固定电容器详细规范 Detail specification for fixed chip ceramic dielectric nonleaded class 1,type CCS411210 capacitors with high reliability
|
2011-12-25 国家军用标准-总装备部 |
| GJB 4157/4-2011 规范 |
CCS411812型高可靠无引线片式1类多层瓷介固定电容器详细规范 Detail specification for fixed chip ceramic dielectric nonleaded class 1,type CCS411812 capacitors with reliability
|
2011-12-25 国家军用标准-总装备部 |
| GJB 4157/5-2011 规范 |
CCS412220型高可靠无引线片式1类多层瓷介固定电容器详细规范 Detail specification for fixed chip ceramic dielectric nonleaded class 1,type CCS412220 capacitors with high reliability
超声波检查 |
2011-12-25 国家军用标准-总装备部 |
| GJB 4157/8-2011 规范 |
CTS411206型高可靠无引线片式2类多层瓷介固定电容器详细规范 Detail specification for fixed chip ceramic dielectric nonleaded class 2,type CTS411206 capacitors with high reliability
超声波检查 |
2011-12-25 国家军用标准-总装备部 |
| GJB 4157/9-2011 规范 |
CTS411210型高可靠无引线片式2类多层瓷介固定电容器详细规范 Detail specification for fixed chip ceramic dielectric nonleaded class 2,type CTS411210 capacitors with high reliability
可焊性 |
2011-12-25 国家军用标准-总装备部 |
Copyright ?2007-2026 ANTPEDIA, All Rights Reserved
京ICP备07018254号 京公网安备1101085018 电信与信息服务业务经营许可证:京ICP证110310号
页面更新时间: 2026-06-06 23:18