美利体育登录入口官网

可靠性预测

Reliability Prediction

半导体器件 机械和气候测试方法 加速耐湿性测试 非偏压HAST

Semiconductor devices. Mechanical and climatic test methods - Accelerated moisture resistance. Unbiased HAST

半导体器件.机械和气候试验方法.第33部分:加速抗湿.无偏压热器

Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave (IEC 60749-33:2004); German version EN 60749-33:2004

半导体器件 机械和气候测试方法 第43部分：IC 可靠性鉴定计划指南（草案）

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

半导体器件机械和气候试验方法第4部分：湿热、稳态、高加速应力试验

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (IEC 60749-4:2017); German version EN 60749-4:2017 / Note: DIN EN 60749-4 (2003-04) remains valid alongside this stand...

光纤互连器件和无源元件可靠性.第3部分:评定无源元件失效模式和失效机理的相关试验(IEC 62005-3:2001)

Reliability of fibre optic interconnecting devices and passive components - Part 3: Relevant tests for evaluating failure modes and failure mechanisms for passive components (IEC 62005-3:2001); German version EN 62005-3:2001

半导体器件.机械和气候试验方法.第4部分：强加速稳态湿热试验（HAST）

Semiconductor devices.Mechanical and climatic test methods.Part 4:Damp heat,steady state,highly accelerated stress test(HAST)

微电子器件试验方法和程序

Microelectronic device test methods and procedures

光纤互连器件和无源元件的可靠性 第 3 部分：无源元件失效模式和机制评估的相关测试（1.0 版）

Reliability of fibre optic interconnecting devices and passive components - Part 3: Relevant tests for the evaluation of failure modes and mechanisms of passive components (Edition 1.0)

芯片 封装相互作用的理解、识别和评价指南

Chip-Package Interaction Understanding, Identification and Evaluation Guideline

半导体器件 机械和环境试验方法 第43部分：集成电路可靠性鉴定试验计划导则（IEC 60749-43:2017）

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans (IEC 60749-43:2017)

半导体器件 机械和环境试验方法 第24部分：加速耐湿性试验 无电源条件下的极快速度冲击试验（IEC 60749-24:2025）

Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST (IEC 60749-24:2025)

半导体器件 半导体器件评估通用指南 第1部分：集成电路可靠性评估指南（IEC 63287-1:2021）

Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (IEC 63287-1:2021)

加热空气用日用管状电热元件等效加速寿命试验方法

Test method for equivalent accelerated life of household tubular electric heating elements for heating air

半导体器件 机械和气候试验方法 第24部分：加速湿气阻抗试验 无偏HAST

Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST

电子元器件失效分类及代码

Electronic component failure classification and code

电子元器件失效机理、模式及影响分析（FMMEA）通用方法和程序

General Methods and Procedures for Failure Mechanism, Modes and Effects Analysis (FMMEA) of Electronic Components

光纤无源组件可靠性：光纤连接器的故障模式及机制

Reliability of Passive Fiber Optic Components: Failure Modes and Mechanisms of Fiber Optic Connectors

半导体器件 机械和气候测试方法 第24部分：加速防潮性 无偏差 hast（由西班牙标准化协会于 2026 年 2 月批准 ）

Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased hast (Endorsed by Asociación Espa?ola de Normalización in February of 2026.)