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测量金属氧化物半导体场效应晶体管（MOSFET）饱和阈值电压的标准测试方法

Standard Test Method for Measuring MOSFET Saturated Threshold Voltage

高压探测器标准规范&x2014；第1部分电压超过600伏AC时使用的电容型

Standard Specification for High Voltage Detectors—Part 1 Capacitive Type to be Used for Voltages Exceeding 600 Volts AC

MOSFET线性阈值电压的测定方法

Measuring MOSFET Linear Threshold Voltage [Metric]

F0617-测量 MOSFET 线性阈值电压的标准测试方法

F0617-Standard Test Method for Measuring MOSFET Linear Threshold Voltage

半导体器件 柔性可拉伸半导体器件 柔性器件电子迁移率、亚阈值摆幅和阈值电压的评价方法

Semiconductor devices. Flexible and stretchable semiconductor devices - Evaluation method for electron mobility, sub-threshold swing, and threshold voltage of flexible devices

SiC MOSFET 阈值电压 VT 测量指南

Guidelines for measuring the threshold voltage V_T of SiC MOSFETs

场效应晶体管.门限电压和截止电压测量方法

Field-effect transistors. Threshold and cut-off voltage measurement technique

金属氧化物半导体场效应管(MOSFET)的基本温度稳定性试验

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

半导体器件.金属氧化物半导体场效应管(MOSFETs)移动离子试验

Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

碳化硅MOSFET阈值电压测量指南

Guidelines for measuring the threshold voltage (VT) of SiC MOSFETs

测量 SiC MOSFET 阈值电压 (VT) 的指南

Guidelines for measuring the threshold voltage (VT) of SiC MOSFETs

金属氧化物半导体场效应晶体管在反向偏置下的温度稳定性研究（IEC 62373:2006）

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006)

NF EN 61243-1-1997的修改件1

Modification 1 of NF EN 61243-1-1997

交流薄膜电致发光矩阵显示器件测试方法

Methods of measurement for a.c.thin film electroluminescent matrix display devices

金属氧化物、半导体、场效应晶体管(MOSFET)的偏置温度稳定性测试

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006). (Endorsed by AENOR in November of 2006.)

半导体器件 金属氧化物半导体场效应晶体管(MOSFET)的移动离子测试

Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)