美利体育登录入口官网:DIN 50450-1:1987
半导体工艺材料的检验.载运气体和添加剂气体中杂质的测定.用五氧化二磷电池测定氢、氧、氮、氩和氦中的水杂质
Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of water impurity in hydrogen, oxygen, nitrogen, argon and helium by using a diphosphorus pentoxide cell