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集成电路.电磁抗干扰测量.第9部分:辐射抗扰度测量.表面扫描法 (IEC/TS 62132-9-2014)

Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method (IEC/TS 62132-9:2014)

集成电路.电磁发射的测量.第1-1部分:一般条件和定义.近场扫描数据交换格式

Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format

集成电路.电磁辐射的测量.第3部分:放射形辐射测量.表面扫描法

Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method

集成电路.电磁抗扰性的测量.第9部分:辐射抗扰性的测量.表面扫描法

Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method

集成电路 电磁辐射测量 一般条件和定义 近场扫描数据交换格式

Integrated circuits. Measurement of electromagnetic emissions. General conditions and definitions. Near-field scan data exchange format

集成电路 电磁辐射测量 辐射发射的测量 表面扫描法

Integrated circuits. Measurement of electromagnetic emissions. Measurement of radiated emissions. Surface scan method

集成电路 电磁抗扰度的测量 辐射抗扰度的测量 表面扫描法

Integrated circuits. Measurement of electromagnetic immunity. Measurement of radiated immunity. Surface scan method

光纤模场直径 测试方法和程序

Optical Fibres - Part 1-45: Measurement Methods and Test Procedures - Mode Field Diameter

光纤 第1部分-45：测量方法和试验程序 模式场直径

Optical fibres. Part 1-45: Measurement methods and test procedures - Mode field diameter (IEC 60793-1-45:2001 corrigendum 2002, modified)

Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method (IEC/TS 61967-3:2014)

Integrierte Schaltungen - Messung von elektromagnetischen Aussendungen - Teil 3: Messung der abgestrahlten Aussendungen - Verfahren der Oberflaechenabtastung (IEC/TS 61967-3:2014)