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用电热蒸发电感耦合等离子体发射光谱法（ETV-ICP-OES）测量石墨中杂质的标准试验方法

Standard Test Method for Measurement of Impurities in Graphite by Electrothermal Vaporization Inductively Coupled Plasma Optical Emission Spectrometry (ETV-ICP-OES)

陶瓷原料和陶瓷材料的测试 采用电热原子化 电感耦合等离子体光学发射光谱法直接测定碳化硅粉末和颗粒中杂质的质量分数

Testing of ceramic raw materials and ceramic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry with electrothermal vaporisation…

陶瓷原材料和基础材料的测试 通过电感耦合等离子体 (ICP OES) 光学发射光谱法和电热汽化法直接测定石墨粉末、颗：涂橹泻哿吭又实闹柿糠质

Testing of ceramic raw and basic materials - Direct determination of mass fractions of trace impurities in powders, granules and lumps of graphite by optical emission spectroscopy by inductively coupled plasma (ICP OES) and by electrothermal vaporizati...

陶瓷原材料和基础材料的测试 通过电感耦合等离子体 (ICP OES) 光学发射光谱法和电热汽化法直接测定石墨粉末、颗：涂橹泻哿吭又实闹柿糠质

Testing of ceramic raw and basic materials - Direct determination of mass fractions of trace impurities in powders, granules and lumps of graphite by optical emission spectroscopy by inductively coupled plasma (ICP OES) and by electrothermal vaporizati...

陶瓷原料和基本材料的试验 电热蒸发 (ETV) 电感耦合等离子体发射光谱法 (ICP-OES) 直接测定碳化硅粉末和颗粒中杂质质量分数（草案）

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

陶瓷原料与陶瓷材料研究 采用电感耦合等离子体光学发射光谱法与电热雾化法直接测定碳化硅粉体和颗粒中的杂质质量分数……

Testing of ceramic raw materials and ceramic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry with electrothermal vaporisation (ETV-I...

陶瓷原料和陶瓷材料的试验 用电热原子化感应耦合等离子体发射光谱法直接测定碳化硅粉末和颗粒中杂质的质量分数

Testing of ceramic raw materials and ceramic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry with electrothermal vaporisation (ETV-I...

陶瓷原料和陶瓷材料的美利体育登录入口官网 采用电热蒸发电感耦合等离子体发射光谱法（ETV-I...）直接测定碳化硅粉末和颗粒中杂质的质量分数

Testing of ceramic raw materials and ceramic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry with electrothermal vaporisation (ETV-I...

陶瓷和基础材料的测试 用电感耦合等离子体发射光谱法（ICP OES）和电热蒸发法（ETV）直接测定碳化硅粉末和颗粒中杂质的质量分数

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

陶瓷和基本材料测试 通过电感耦合等离子体光发射光谱法（ICP OES）结合电热蒸汽化（ETV）直接测定硅 carbide 粉末和颗粒中杂质的质量分数

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

陶瓷原料和陶瓷材料的试验 用电热蒸发 电感耦合等离子体光学发射光谱法直接测定碳化硅粉末和颗粒中杂质的质量分数

Testing of ceramic raw materials and ceramic materials — Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry with electrothermal vaporisation (ETV-I...

陶瓷和基础材料的测试 电感耦合等离子体发射光谱法直接测定碳化硅粉末和颗粒中杂质的质量分数

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV) (Endor...